IMID 2022, Pusan, Korea
August 23 - August 26, 2022 (Tue. - Fri.), Bexco
Adaptive Frequency Driving Scan Driver Combined with Logic Circuit based on a-InGaZnO TFTs
Jinho Moon, Eseudeo Yun, Yongchan Kim, and Hojin Lee
Abstract
Recently, due
to the interest on flexible, wearble, and portable electronics as futre
technologies, the demand for high-resolution display is expended. Although, faster
frame rate and smaller area for the display is required, increased power
consumption is incurred in high-performance display. Typically, for
high-resolution displays, amorphous indium gallium zinc oxide thin film
transistor (a-InGaZnO TFT) is actively researched because of its’ visible
transparency, good uniformity, and utmost low off-current advantages rather
than low temperature polycrystalline silicon (LTPS) TFT and amorphous silicon
(a-Si) TFT. However, the a-InGaZnO TFT operates in depletion-mode because VTH
has negative values by the different indium component ratio and by the
electrical characteristic variation due to the different bias stress such as
illumination and bias stress. In this paper, we propose a adaptive
frequency driving scan driver based on a-InGaZnO TFT with depletion-mode
operation.
