IMID 2023, Pusan, Korea
August 22 - August 25, 2023 (Tue. - Fri.), Bexco
a-InGaZnO TFT Scan Driver for Extra Period Function with Compensating Depletion-mode
Jinho Moon, Yongchan Kim, Hyunwoo Kim, and Hojin Lee
Abstract
Recently, with the development of future technologies that enable high-resolution displays, interest in higher frame rates and larger display areas has increased. However, these displays face issues with limited pixel areas, and external pixel compensation circuits are necessary. Nevertheless, external pixel compensation cannot be properly performed due to a lack of sensing time. To overcome this problem, we propose a scan driver based on a-InGaZnO transistors, which are responsible for controlling the switching TFTs in the pixel circuit. To further improve compensation, we combined a memory function block at the input of the scan driver, which provides extra sensing periods for pixel circuits, thereby improving compensation accuracy. Additionally, we utilized the capacitive coupling effect to enhance the performance of the scan driver and also to improve the depletion-mode operation, which can be caused by oxide TFTs. The proposed scan driver allows for improved signal transfer between the pixel circuit and the scan driver, resulting in better compensation accuracy.
