SID Display Week 2022, San Jose, USA
May 9 - May 13, 2022 (Mon. - Fri.), McEnery Convention Center
Adaptive Frequency Driving Scan Driver with NOR Logic Gate Based on a-InGaZnO TFTs
Jinho Moon, Eseudeo Yun, Yongchan Kim, Kwun-Bum Chung, and Hojin Lee
Abstract
A scan driver combined with NOR Logic gate using amorphous indium-gallium-zinc-oxide (a-InGaZnO) thin-film transistors (TFTs) is proposed. NOR logic gate masks the output signal from the scan driver in order to control the driving frequency. Proposed frequency adaptive scan driver is expected to reduce power consumption depending on the display contents.
